Dr. M. Alper Sahiner received his Ph.D. in Physics from Rutgers University in 1995. After completing his post-doctoral studies in Simon Fraser University, he had worked at the Brookhaven National Laboratory as a beamline scientist between 1997-1999. During 1999-2003 he had worked as a senior scientist at Evans Analytical Group,which is a distinguished worldwide network of surface characterization laboratories. After joining Seton Hall University in 2003, Dr. Sahiner developed a advanced materials synthesis and characterization laboratory. His research interests are in the area of semiconductor materials. He is looking for solutions for the major materials based problems of the semiconductor industry by developing new advanced materials. His research also focuses in developing high-efficiency solar cells as alternative solutions for the world's clean energy generation problem. Specifically, Dr. Sahiner works on the synthesis of thin films of hafnium based high-k dielectric materials, colossal magnetoresistive (CMR) oxides and photovoltaic (solar cells) systems using pulsed laser deposition techniques. Structural and electrical characterizations of these materials are performed by x-ray diffraction and in-house electrical experimental set-ups. Further structural x-ray characterization experiments are performed at the Brookhaven National Laboratory in Long Island, NY.
- Ph.D., Rutgers, The State University, 1995
- B.S. in Physics, Bogazici University, 1989
- B.S. in Electrical Engineering, Bogazici University, 1989
- "Synchrotron XPS and EXAFS Identification of Chemical State and Crystal Phase Changes of HfO2 Films Doped with Si, N, Al, and La", VLSl Technology Systems and Applications (VLSI-TSA), 26, 82-83; IEEE Xplore Digital Library, June 2010
- "Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment", Journal of Vacuum Science and Technology B, 28(1), C1B1- B5, March 2010
- "Local Crystal Structural Modifications in Pulsed Laser Deposited High-K Dielectric Thin Films on Silicon and Germanium", Material Science in Semiconductor Processing, 11(6), 245- 249, October 2009
- "Characterization of Junction Activation and Deactivation Using non-Equilibrium Annealing: Solid Phase Epitaxy, Spike Annealing, Laser Annealing", Journal of Vacuum Science and Technology B; IEEE Proceedings on The 9th International Workshop on Junction Technology, 64-68, June 2009
- "Local CrystalStructure Modifications in Pulsed Laser Deposited Colossal MagnetoresistiveOxide Thin Films", Material Research Society Proceedings, 1118, K05-08, February 2009
- "Correlation of Local Structure and Electrical Actiation in Arsenic Ultrashallow Junctions
Journal of Applied Physics, 104(10), January 2009
Managing Guest Editor,(2014-present) Materials Science in Semiconductor Processing (Elsevier)
Editorial Board Member, (2014-present) Materials Science in Semiconductor Processing (Elsevier)
- SHU-NJSGC (NASA) Summer Undergraduate Student Research Fellowships Grant. $19,200. (2014-2015).
- National Science Foundation (Co-PI with Lopez), Partial Organizational Support For The 4th Summer Institute On Complex Plasmas. $7,000. (2014-2015).
- National Science Foundation (Co-PI with Lopez), Partial Organizational Support for the 3rd Summer Institute on Complex Plasmas. $9,700.(2012-2013).
- Department of Defense - Army Research Office (Co-PI with Lopez), "Partial Support for the 3rd Summer Institute” $6,600 (2012-2013)
- Department of Energy (Co-PI with Lopez) “Organizational Support for the 3rd Summer Institute on Complex Plasmas” $7,900 (2012-2013).
- SEMATECH Grant “EXAFS Modeling and Analysis of Advanced Substrates, Dielectrics and Contacts" $50,000 (2010-12)
- New Jersey Space Grant Consortium Fellowship Grant $8000, (2011)
- New Jersey Space Grant Consortium Fellowship Grant $6000, (2010)
- SHU University Research Council Grant "High Efficiency Solar Cells for Future Energy Solutions: Synthesis and Electrical Characterization" $6000 (2009)
- Higher Education Commission Visiting Scholar Grant “Pulsed Laser Deposition and Electrical and Structural Characterization of Transition Metal Oxides” $6700 (2008)
- Research Corporation $40,574 (2005-2007)
- National Science Foundation MRI-DMI $383,208 (2004-2006)